Probing Charges on the Atomic Scale by Means of Atomic Force Microscopy

Author(s): F. Albrecht, J. Repp, M. Fleischmann, M. Scheer, M. Ondráček, and P. Jelínek

A new scanning-probe-microscopy technique can image the polarity of individual chemical bonds.

[Phys. Rev. Lett. 115, 076101] Published Thu Aug 13, 2015