Author(s): I. A. Larkin, K. Keil, A. Vagov, M. D. Croitoru, and V. M. Axt
A third regime of electric field decay at a metal-dielectric interface is predicted, in which the field decays even more slowly than the previously known regimes.
[Phys. Rev. Lett. 119, 176801] Published Tue Oct 24, 2017