Author(s): Eiichi Inami and Yoshiaki Sugimoto
A new technique in atomic force microscopy more accurately measures the electrostatic force between the probe and the surface.
[Phys. Rev. Lett. 114, 246102] Published Fri Jun 19, 2015
Elu, loodus, teadus ja tehnoloogia
Author(s): Eiichi Inami and Yoshiaki Sugimoto
A new technique in atomic force microscopy more accurately measures the electrostatic force between the probe and the surface.
[Phys. Rev. Lett. 114, 246102] Published Fri Jun 19, 2015